Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon

Journal article

Y. N. Mohapatra, P. Girl
1998

Semantic Scholar DOI

Cite

APA Click to copy
Mohapatra, Y. N., & Girl, P. (1998). Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon.

Chicago/Turabian Click to copy
Mohapatra, Y. N., and P. Girl. “Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon” (1998).

MLA Click to copy
Mohapatra, Y. N., and P. Girl. Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon. 1998.

BibTeX Click to copy

@article{y1998a,
  title = {Evidence of Defect Migration and Clustering in MeV Heavy Ion Damaged Silicon},
  year = {1998},
  author = {Mohapatra, Y. N. and Girl, P.}
}