Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation

Journal article

P. Giri, Y. N. Mohapatra
2000

Semantic Scholar DOI

Cite

APA Click to copy
Giri, P., & Mohapatra, Y. N. (2000). Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation.

Chicago/Turabian Click to copy
Giri, P., and Y. N. Mohapatra. “Unusual Features in Trap Emission Characteristics of Heavily Damaged Silicon Induced by MeV Ion Implantation” (2000).

MLA Click to copy
Giri, P., and Y. N. Mohapatra. Unusual Features in Trap Emission Characteristics of Heavily Damaged Silicon Induced by MeV Ion Implantation. 2000.

BibTeX Click to copy

@article{p2000a,
  title = {Unusual features in trap emission characteristics of heavily damaged silicon induced by MeV ion implantation},
  year = {2000},
  author = {Giri, P. and Mohapatra, Y. N.}
}